Tweet
• May 23 at the University of Wisconsin Facilities Day
• June 6 at the University of Illinois Urbana-Champaign, Advanced Characterization Meeting
The new Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results, a simpler user experience, and the versatility to excel in both academic research and industrial R&D laboratories.
Sign up for your demo! (https://afm.oxinst.com/events-and-wo...-workshop-2019)
Attached Files