Jupiter demos coming to University of Wiscons, May 23 and UIUC, June 6

Jupiter demos coming to University of Wiscons, May 23 and UIUC, June 6
See the new Jupiter XR large-sample AFM in action! We'll be doing free demonstrations in conjunction with these upcoming events:

• May 23 at the University of Wisconsin Facilities Day

• June 6 at the University of Illinois Urbana-Champaign, Advanced Characterization Meeting

The new Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results, a simpler user experience, and the versatility to excel in both academic research and industrial R&D laboratories.

Sign up for your demo! (https://afm.oxinst.com/events-and-wo...-workshop-2019)

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Jupiter demos coming to University of Wiscons, May 23 and UIUC, June 6

by Terry Mehr

See the new Jupiter XR large-sample AFM in action! We'll be doing free demonstrations in conjunction with these upcoming events:

• May 23 at the University of Wisconsin Facilities Day

• June 6 at the University of Illinois Urbana-Champaign, Advanced Characterization Meeting

The new Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200...
- Channel: News, Views and Events
2019-05-13, 12:00 PM
Demo the New Jupiter XR Large-Sample AFM at These Upcoming Events in May and June

by Terry Mehr

...
- Channel: News, Views and Events
2019-05-07, 10:33 AM
Video-Rate AFM Webinar June 7

by Terry Mehr

Join us for this webinar that presents the latest results and innovations using video-rate atomic force microscopy (AFM) with the Cypher VRS Video-Rate AFM.

Wednesday, June 7, 8:00am PDT | 11:00 EDT |16:00 BST | 17:00 CEST. Register at: http://www.oxford-instruments.com/afm-webinars
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AR Presents the Webinar: AFM Characterization of 2D Materials

by nushaw

Dr. Andras Kis of EPFL, Institute of Electrical Engineering, and Keith Jones, Asylum Research's nanoelectrical characterization specialist are your hosts. They discuss the integral role of AFM in 2D materials research, and present the tools and techniques used to successfully characterize a variety of 2D materials used for device manufacturing, energy storage and optoelectronics. Learn about AFM modes for mapping physical properties and see how these modes are used to characterize local electrical,...
- Channel: News, Views and Events
2016-11-15, 04:35 PM
AR Presents the Webinar: How to Choose the Right Probe for Your AFM Experiments

by nushaw
Webinar: How to Choose the Right AFM Probe
Recorded live on September 8th, 2016
GO TO RECORDING NOW ⇨
Did you know that successful AFM imaging starts with the probe?

In order to get consistently successful results, AFM probe selection is one of the most important decisions you'll make in your AFM research. But how do you choose from all the possible probes, scan modes, and scanning conditions? Please join us to find out.
Webinar topics covered:
- AFM probe fundamentals
...
- Channel: News, Views and Events
2016-08-26, 04:30 PM
Upcoming webinar: "More Than Just Roughness" - June 1st

by nushaw

Upcoming webinar: "More Than Just Roughness"

Join the free webinar on June 1 to learn AFM techniques to characterize thin films:

http://bit.ly/TFAFMWebinar2016

...
- Channel: News, Views and Events
2016-05-23, 04:40 PM

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Jupiter demos coming to University of Wiscons, May 23 and UIUC, June 6

Jupiter demos coming to University of Wiscons, May 23 and UIUC, June 6

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